Scanning Electron Microscope (SEM) (4)

"Mag" stands for magnification and zoom. Moving to the desired position can be done by clicking the mouse wheel. A higher scan speed reduces noise but results in slower image output. Lower speeds generate more noise but produce faster images. The STG incident angle refers to the angle at which the electron beam is incident. This button is usually not adjusted. Pressing the "auto" button adjusts ..

2023.08.17