Scanning Electron Microscope (SEM) (4)

"Mag" stands for magnification and zoom. Moving to the desired position can be done by clicking the mouse wheel.

 

A higher scan speed reduces noise but results in slower image output. Lower speeds generate more noise but produce faster images.

 

The STG incident angle refers to the angle at which the electron beam is incident. This button is usually not adjusted.

 

Pressing the "auto" button adjusts the brightness automatically. By clicking the sun icon, you can adjust the brightness by turning the wheel.

 

Summarizing the functions of each button:

 

Mode: Mode

WD: Focus

Mag: Magnification and zoom

Scan: Scan speed

STG: Incident angle

Auto: Automatic brightness adjustment

Once you have the desired image, you need to take a photograph.

 

Press the "acquire image" button to bring up the captured image, and the "Save As" window will automatically appear.

 

If you want to identify the elements present in the SEM image, you can use the EDS window to check.

 

4. Turning Off the SEM

After SEM imaging is complete, it's advisable to raise Z and WD&Z back to their original positions before releasing the vacuum, essentially lowering the height. This prevents the sample from hitting the lens when you retrieve it.

 

Once the heights are lowered, press "vent" to release the vacuum.

 

When the vacuum is fully released, open the SEM door and remove the measured sample.

 

While this step can be skipped, it's also a good idea to use the "pump" function in the empty SEM state to maintain vacuum and prevent foreign particles from entering the SEM machine.

 

In this manner, today we've explored the latter part of using the Scanning Electron Microscope (SEM).

 

I will return with instructions for using other equipment.